Nanoscale Investigations in Dielectrics Charging by Electrostatic Force Microscopy

A. BELARNI¹, M. LAMHAMDI¹, P. PONS¹, L. BOUDOU², J. GUASTAVINO², Y. SEGUI², G. PAPAIOANNOU³, M. DILHAN¹, R. PLANA<sup>1

1</sup>University of Toulouse LAAS CNRS, 7, avenue du Colonel Roche, Toulouse France
²University of Toulouse LAPLACE, 118, route de Narbonne, 31077 Toulouse France
³Solid State Physics Section, Univ. of Athens, Panepistimiopolis Zografos, Athens Greece

Abstract. We shall describe in this article the technique of use the electrostatic force microscope like a tool for charging a dielectric and imaging. The images obtained enable us to represent the evolution of the charges according to time and this way of understanding the mechanisms of transport of the charges in the dielectric one.